Microelectronics Reliability Impact Factor in Nanotechnology

About Microelectronics Reliability

Microelectronics Reliability is a journal covering the technologies/fields/categories related to Safety, Risk, Reliability and Quality (Q2); Atomic and Molecular Physics, and Optics (Q3); Condensed Matter Physics (Q3); Electrical and Electronic Engineering (Q3); Electronic, Optical and Magnetic Materials (Q3); Nanoscience and Nanotechnology (Q3); Surfaces, Coatings and Films (Q3). It is published by Elsevier Ltd.. The overall rank of Microelectronics Reliability is 13355.According to SCImago Journal Rank (SJR), this journal is ranked 0.364. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come. SJR acts as an alternative to the Journal Impact Factor (or an average number of citations received in last 2 years). This journal has an h-index of 101. The best quartile for this journal is Q2.The ISSN of Microelectronics Reliability journal is 00262714.An International Standard Serial Number (ISSN) is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic. Microelectronics Reliability is cited by a total of 1822 articles during the last 3 years (Preceding 2022).