Surface Topography: Metrology and Properties Impact Factor in Chemistry Journals

About Surface Topography: Metrology and Properties

Surface Topography: Metrology and Properties is a journal covering the technologies/fields/categories related to Materials Chemistry (Q2); Surfaces, Coatings and Films (Q2); Instrumentation (Q3); Process Chemistry and Technology (Q3). It is published by IOP Publishing Ltd.. The overall rank of Surface Topography: Metrology and Properties is 11994.According to SCImago Journal Rank (SJR), this journal is ranked 0.422. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come. SJR acts as an alternative to the Journal Impact Factor (or an average number of citations received in last 2 years). This journal has an h-index of 31. The best quartile for this journal is Q2.The ISSN of Surface Topography: Metrology and Properties journal is 2051672X.An International Standard Serial Number (ISSN) is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic. Surface Topography: Metrology and Properties is cited by a total of 1094 articles during the last 3 years (Preceding 2022).